A Study of the Effects of Transient Fault Injection into the VHDL Model of a Fault-Tolerant Microcomputer System

  • Authors:
  • D. Gil;J. Gracia;J. C. Baraza;P. J. Gil

  • Affiliations:
  • -;-;-;-

  • Venue:
  • IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)
  • Year:
  • 2000

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Abstract

This work presents a campaign of fault injection to validate the Dependability of a fault tolerant microcomputer system. The system is duplex with cold stand-by sparing, parity detection and a watchdog timer. The faults have been injected on a chip-level VHDL model, using an injection tool designed for this purpose. We have carried out a set of injection experiments (with 3000 injections each), injecting transient faults of types stuck-at, bit-flip, indetermination and delay on both the signals and variables of the system, running two different workloads. We have analyzed the pathology of the propagated errors, measured their latency, and calculated both detection and recovery coverage. For instance, system detection cover-ages (including non-effective errors) up to 98%, and sys-tem recovery coverage up to 94% have been obtained for short transient faults.