Diagnosis of Sequence-Dependent Chips

Authors:
James C. -M. Li;E. J. McCluskey
Affiliations:
-;-
Venue:
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Year:
2002

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Abstract

A technique capable of diagnosing single and multiple stuck-open and stuck-at faults is presented. Eleven sequence-dependent chips (test results depend on the order of test patterns) are diagnosed. Seven of them are diagnosed as having single stuck-open faults. Two of them are diagnosed as having multiple stuck-at and stuck-open faults.