Analysis of Test Application Time for Test Data Compression Methods Based on Compression Codes
Journal of Electronic Testing: Theory and Applications
XPAND: An Efficient Test Stimulus Compression Technique
IEEE Transactions on Computers
Efficient test-data compression for IP cores using multilevel Huffman coding
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Test data compression scheme based on variable-to-fixed-plus-variable-length coding
Journal of Systems Architecture: the EUROMICRO Journal
Scan-chain partition for high test-data compressibility and low shift power under routing constraint
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Compression-aware capture power reduction for at-speed testing
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Test Data Compression Using Selective Sparse Storage
Journal of Electronic Testing: Theory and Applications
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Run-length codes and their variants have recently been shown to be very effective for compressing system-on-a-chip (SOC) test data. In this paper, we analyze the Golomb code, the conventional run-length code and the FDR code for a binary memoryless data source, and compare the compression obtained in each case to fundamental entropy bounds. We show analytically that the FDR code out-performs both the conventional run-length code and the Golomb code for test resource partitioning (TRP) based on data compression. We also present a modified compression/decompression architecture for obtaining even higher compression. We demonstrate the effectiveness of these compression codes using the larger ISCAS-89 benchmark circuits and two representative circuits from industry. Finally, we show that the FDR code is almost as effective as Unix utilities gzip and compress, even though it uses a much simpler decompression algorithm.