A statistical model for estimating the effect of process variations on crosstalk noise

Authors:
Maurizio Martina;Guido Masera
Affiliations:
CERCOM - Dipartimento di Elettronica, Politecnico di Torino, Torino, Italy;CERCOM - Dipartimento di Elettronica, Politecnico di Torino, Torino, Italy
Venue:
Proceedings of the 2004 international workshop on System level interconnect prediction
Year:
2004

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Abstract

Noise violation analysis due to crosstalk is recognized as one of the most challenging problems in Ultra Deep Submicron circuits, besides statistical techniques seem to be a promising approach both for early estimation and final signoff tasks. In this work a general closed form for the voltage distribution on the victim line, based on capacitance statistical distributions, is derived. Experimental results show that the proposed methodology is reliable to early estimate the effect of process variations on crosstalk noise.