Application of constraint-based heuristics in collaborative design
Proceedings of the 38th annual Design Automation Conference
Embedding infrastructure IP for SOC yield improvement
Proceedings of the 39th annual Design Automation Conference
OPERA: optimization with ellipsoidal uncertainty for robust analog IC design
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Statistical framework for technology-model-product co-design and convergence
Proceedings of the 44th annual Design Automation Conference
Statistical performance modeling and optimization
Foundations and Trends in Electronic Design Automation
Test exploration and validation using transaction level models
Proceedings of the Conference on Design, Automation and Test in Europe
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Today's semiconductor manufacturing trends are increasingly influencing hardware design techniques, tools, and methodologies. This article analyzes these trends and describes their effects on design methodologies. These effects clearly include impacts on yield optimization, resolution enhancement, testability, and cost.