Accurate capture of timing parameters in inductively-coupled on-chip interconnects

Authors:
T. Murgan;C. Schlachta;M. Petrov;L. Indrusiak;A. García;M. Glesner;R. Reis
Affiliations:
Darmstadt Univ. of Technology, Darmstadt, Germany;Darmstadt Univ. of Technology, Darmstadt, Germany;Darmstadt Univ. of Technology, Darmstadt, Germany;Darmstadt Univ. of Technology, Darmstadt, Germany;IBM Deutschland, Böblingen, Germany;Darmstadt Univ. of Technology, Darmstadt, Germany;Microelectronics Group, Porto Alegre, Brazil
Venue:
SBCCI '04 Proceedings of the 17th symposium on Integrated circuits and system design
Year:
2004

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Abstract

With continuously increasing on-chip frequencies and shortening signal rise time, inductance effects pose sever difficulties on efficient timing analysis. This work analyses the effects on different timing parameters of the inductive coupling in long and intermediate high-frequency on-chip interconnects. We show that crosstalk, noise, signal integrity, signal rise and fall times, all depend on the data toggling pattern. Moreover, the conclusion is drawn that the worst and best case switching patterns are not necessarily similar for capacitively coupled dominant and for mainly inductively coupled lines.