Application-independent defect tolerance of reconfigurable nanoarchitectures
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Application-independent defect-tolerant crossbar nano-architectures
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
On the use of Bloom filters for defect maps in nanocomputing
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Low-overhead defect tolerance in crossbar nanoarchitectures
ACM Journal on Emerging Technologies in Computing Systems (JETC)
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Using randomization to cope with circuit uncertainty
Proceedings of the Conference on Design, Automation and Test in Europe
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It is anticipated that defect densities in bottom-up self-assembled nanotechnology are much higher than those in conventional VLSI technologies. Therefore, defect tolerance needs to be included in various steps of the design automation flow. In this paper, a new defect tolerant flow is proposed and a new yield metric, based on this flow, is defined. This metric is evaluated for various molecular crossbars with different defect densities. Test and diagnosis of molecular crossbars, as the main building blocks in this technology, are also investigated.