Modeling Defect Spatial Distribution
IEEE Transactions on Computers
NanoFabrics: spatial computing using molecular electronics
ISCA '01 Proceedings of the 28th annual international symposium on Computer architecture
Molecular electronics: devices, systems and tools for gigagate, gigabit chips
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Nanowire-based sublithographic programmable logic arrays
FPGA '04 Proceedings of the 2004 ACM/SIGDA 12th international symposium on Field programmable gate arrays
On the Defect Tolerance of Nano-Scale Two-Dimensional Crossbars
DFT '04 Proceedings of the Defect and Fault Tolerance in VLSI Systems, 19th IEEE International Symposium
Defects, Yield, and Design in Sublithographic Nano-electronics
DFT '05 Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
A mapping algorithm for defect-tolerance of reconfigurable nano-architectures
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Array-based architecture for FET-based, nanoscale electronics
IEEE Transactions on Nanotechnology
Stochastic assembly of sublithographic nanoscale interfaces
IEEE Transactions on Nanotechnology
Engineering of Software-Intensive Systems: State of the Art and Research Challenges
Software-Intensive Systems and New Computing Paradigms
Low-overhead defect tolerance in crossbar nanoarchitectures
ACM Journal on Emerging Technologies in Computing Systems (JETC)
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Digital VLSI logic technology using Carbon Nanotube FETs: frequently asked questions
Proceedings of the 46th Annual Design Automation Conference
Variation tolerant logic mapping for crossbar array nano architectures
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
Runtime analysis for defect-tolerant logic mapping on nanoscale crossbar architectures
NANOARCH '09 Proceedings of the 2009 IEEE/ACM International Symposium on Nanoscale Architectures
Defect-Aware Nanocrossbar Logic Mapping through Matrix Canonization Using Two-Dimensional Radix Sort
ACM Journal on Emerging Technologies in Computing Systems (JETC)
ILP formulations for variation/defect-tolerant logic mapping on crossbar nano-architectures
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Hi-index | 0.00 |
Self-assembled nanofabrication processes yield regular and reconfigurable devices. However, defect densities in this emerging nanotechnology are higher than those in conventional lithography-based VLSI. In this article, we present an application-independent defect tolerant design flow to minimize customized postfabrication design efforts to be performed per chip. In this flow, higher level design steps are not needed to be aware of the existence and the location of defects in the chip. Only a final mapping step is required to be defect aware. Application independence of this flow minimizes the number of per-chip design steps, making it appropriate for high volume production. We also present two mapping algorithms, recursive and greedy, which make the connection between defect-unaware design steps and the final defect-aware mapping step. Experiments show that the results obtained by the greedy algorithm are very close to the exact solutions. Using these algorithms, we analyze the manufacturing yield of molecular crossbars under different defect distribution models. We report on the size of the minimum crossbar to be fabricated such that a defect-free crossbar of the desirable size can be found with a guaranteed manufacturing yield.