NanoFabrics: spatial computing using molecular electronics
ISCA '01 Proceedings of the 28th annual international symposium on Computer architecture
Molecular electronics: devices, systems and tools for gigagate, gigabit chips
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
On the Defect Tolerance of Nano-Scale Two-Dimensional Crossbars
DFT '04 Proceedings of the Defect and Fault Tolerance in VLSI Systems, 19th IEEE International Symposium
Defects, Yield, and Design in Sublithographic Nano-electronics
DFT '05 Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
CAEN-BIST: Testing the NanoFabric
ITC '04 Proceedings of the International Test Conference on International Test Conference
A mapping algorithm for defect-tolerance of reconfigurable nano-architectures
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Array-based architecture for FET-based, nanoscale electronics
IEEE Transactions on Nanotechnology
Low-overhead defect tolerance in crossbar nanoarchitectures
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Online multiple error detection in crossbar nano-architectures
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
Online detection of multiple faults in crossbar nano-architectures using dual rail implementations
NANOARCH '09 Proceedings of the 2009 IEEE/ACM International Symposium on Nanoscale Architectures
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Defect tolerance is a major issue in nano computing. In this paper, an application-independent defect tolerant scheme for reconfigurable crossbar nano-architectures is presented. Architectural features are developed to reliably connect local defect-free subsets of crossbars in order to generate a defect-free architecture. It is also shown how to further reduce the area overhead associated with this flow by relaxing some constraints on the defect-free subsets. Experimental results show more than 9x reduction in the area overhead without any negative impact on the usability of modified defect-free subsets.