Improving boundary element methods for parasitic extraction

  • Authors:
  • Shu Yan;Jianguo Liu;Weiping Shi

  • Affiliations:
  • Texas A&M University, College Station, TX;University of North Texas, Denton, TX;Texas A&M University, College Station, TX

  • Venue:
  • ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
  • Year:
  • 2003

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Abstract

We improve the accuracy and speed of boundary element method (BEM) or multipole accelerated BEM for interconnect parasitic extraction. Three techniques are presented and applied to capacitance extraction: selective coefficient enhancement, variable order multipole and multigrid. Experimental results show that the techniques are effective for extracting parasitics between all pairs of conductors, or between selected pairs of conductors.