Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors

Authors:
Vishwanath Natarajan;Soumendu Bhattacharya;Abhijit Chatterjee
Affiliations:
Georgia Intitute of Technology;Georgia Institute of Technology;Georgia Institute of Technology
Venue:
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
Year:
2006

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Abstract

Path delay fault simulation performance on multi-cycle delay paths common in industrial designs is discussed using paths from a large block in a microprocessor and a functional test vector suite. We profile fault simulation performance using a novel ...