Polarization-Based Material Classification from Specular Reflection
IEEE Transactions on Pattern Analysis and Machine Intelligence
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IEEE Transactions on Pattern Analysis and Machine Intelligence
Reflection from layered surfaces due to subsurface scattering
SIGGRAPH '93 Proceedings of the 20th annual conference on Computer graphics and interactive techniques
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International Journal of Computer Vision
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Reflectance and texture of real-world surfaces
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Proceedings of the 28th annual conference on Computer graphics and interactive techniques
A practical model for subsurface light transport
Proceedings of the 28th annual conference on Computer graphics and interactive techniques
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IEEE Transactions on Pattern Analysis and Machine Intelligence
Image-based reconstruction of spatial appearance and geometric detail
ACM Transactions on Graphics (TOG)
Real-time Photo-Realistic Physically Based Rendering of Fine Scale Human Skin Structure
Proceedings of the 12th Eurographics Workshop on Rendering Techniques
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CGI '01 Computer Graphics International 2001
ICCV '99 Proceedings of the International Conference on Computer Vision-Volume 2 - Volume 2
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ICCV '03 Proceedings of the Ninth IEEE International Conference on Computer Vision - Volume 2
ACM SIGGRAPH 2003 Sketches & Applications
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EGSR'04 Proceedings of the Fifteenth Eurographics conference on Rendering Techniques
Circularly polarized spherical illumination reflectometry
ACM SIGGRAPH Asia 2010 papers
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ACM SIGGRAPH 2012 Courses
Estimating surface normals from spherical stokes reflectance fields
ECCV'12 Proceedings of the 12th international conference on Computer Vision - Volume 2
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Polarization has been used in numerous prior studies for separating diffuse and specular reflectance components, but in this work we show that it also can be used to separate surface reflectance contributions from individual light sources. Our approach is called polarization multiplexing and it has a significant impact in appearance modeling where the image as a function of illumination direction is needed. Multiple unknown light sources can illuminate the scene simultaneously, and the individual contributions to the overall surface reflectance are estimated. Polarization multiplexing relies on the relationship between the light source direction and the intensity modulation. Inverting this transformation enables the individual intensity contributions to be estimated. In addition to polarization multiplexing, we show that phase histograms from the intensity modulations can be used to estimate scene properties including the number of light sources.