Thermal and Power Management of Integrated Circuits (Series on Integrated Circuits and Systems)

Design for burn-in test: a technique for burn-in thermal stability under die-to-die parameter variations

Proceedings of the 2009 Asia and South Pacific Design Automation Conference

Genetic algorithm-based FSM synthesis with area-power trade-offs

Integration, the VLSI Journal

DFT and minimum leakage pattern generation for static power reduction during test and burn-in

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

ESL solutions for low power design

Proceedings of the International Conference on Computer-Aided Design

Crank it up or dial it down: coordinated multiprocessor frequency and folding control

Proceedings of the 46th Annual IEEE/ACM International Symposium on Microarchitecture