ATPG for heat dissipation minimization during scan testing
DAC '97 Proceedings of the 34th annual Design Automation Conference
Survey of Low-Power Testing of VLSI Circuits
IEEE Design & Test
ATPG for Heat Dissipation Minimization During Test Application
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Adapting Scan Architectures for Low Power Operation
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Minimized Power Consumption For Scan-Based Bist
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Testing of Digital Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DS-LFSR: a BIST TPG for low switching activity
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In this paper we propose a new approach to generate a primary input blocking pattern for applying to the primary inputs during shift cycle such that the switching activity occurred in the combinational part of the circuit under test can be suppressed as much as possible. The primary input blocking technique suppresses transitions of gates in the combinational part during scan by assigning controlling values to one of the gates' inputs. However, simultaneously assigning controlling values to the gates may result in conflicts in the setting of binary values on the primary inputs. Instead of the heuristics based on fanout in other approaches, we use the impact function which is based on transition density to determine the priorities of the gates to be blocked. Experiments performed on the ISCAS 89 benchmark circuits show that the proposed approach can always produce better results than the existing approaches.