Scalable defect mapping and configuration of memory-based nanofabrics

Authors:
Chen He;M. F. Jacome;G. de Veciana
Affiliations:
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA;Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA;Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Venue:
HLDVT '05 Proceedings of the High-Level Design Validation and Test Workshop, 2005. on Tenth IEEE International
Year:
2005

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Abstract

Deterministic functional test pattern generation has been a long-standing open problem, which is an important problem to be solved for both design verification and manufacturing testing. One key to develop a practical functional test pattern generation ...