Non-RF to RF Test Correlation Using Learning Machines: A Case Study

Authors:
Haralampos-G. D. Stratigopoulos;Petros Drineas;Mustapha Slamani;Yiorgos Makris
Affiliations:
TIMA Laboratory, France;Rensselaer Polytechnic Institute, USA;IBM, USA;Yale University, USA
Venue:
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
Year:
2007

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Abstract

Multiple Input Multiple Output (MIMO) based systems have recently received a lot of attention as their projected data rate is twice as fast as the currently available systems. Due to the increased number of RF paths, the testing becomes more complicated, ...