Dynamic effects in the detection of bridging faults in CMOS ICs
Journal of Electronic Testing: Theory and Applications
Self-Checking Detection and Diagnosis of Transient, Delay, and Crosstalk Faults Affecting Bus Lines
IEEE Transactions on Computers
Defect-Based Delay Testing of Resistive Vias-Contacts A Critical Evaluation
ITC '99 Proceedings of the 1999 IEEE International Test Conference
On Hazard-free Patterns for Fine-delay Fault Testing
ITC '04 Proceedings of the International Test Conference on International Test Conference
Evaluating the Effectiveness of Detecting Delay Defects in the Slack Interval: A Simulation Study
ITC '04 Proceedings of the International Test Conference on International Test Conference
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Testing resistive opens and bridging faults through pulse propagation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
| Hi-index | 0.00 |
This paper addresses the problems related to resistive opens and bridging faults which cannot be detected using delay fault testing because they lie out of the most critical paths. Even if the induced defect is not large enough to result in timing violations, these faults may give rise to reliability problems. To detect them, we propose a testing method that is based on the propagation of pulses within the faulty circuit and that exploits the degraded capabity of faulty paths to propagate pulses. The effectiveness of the proposed method is analyzed at the electrical level and compared with the use of reduced clock period which can detect the same class of faults. Results show similar performance in the case of resistive opens and better performance in the case of bridgings. Moreover, the proposed approach is not affected by problems on the clock distribution network.