Simulation of specular surface imaging based on computer graphics: application on a vision inspection system

Authors:
Ralph Seulin;Frederic Merienne;Patrick Gorria
Affiliations:
Laboratoire Le2i, CNRS FRE, Université de Bourgogne, Le Creusot, France;Laboratoire Le2i, CNRS FRE, Université de Bourgogne, Le Creusot, France;Laboratoire Le2i, CNRS FRE, Université de Bourgogne, Le Creusot, France
Venue:
EURASIP Journal on Applied Signal Processing
Year:
2002

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Abstract

This work aims at detecting surface defects on reflecting industrial parts. A machine vision system, performing the detection of geometric aspect surface defects, is completely described. The revealing of defects is realized by a particular lighting device. It has been carefully designed to ensure the imaging of defects. The lighting system simplifies a lot the image processing for defect segmentation and so a real-time inspection of reflective products is possible. To bring help in the conception of imaging conditions, a complete simulation is proposed. The simulation, based on computer graphics, enables the rendering of realistic images. Simulation provides here a very efficient way to perform tests compared to the numerous attempts of manual experiments.