An Augmented Iterative Array for High-Speed Binary Division
IEEE Transactions on Computers
IEEE Transactions on Computers
Fault Detection in Iterative Logic Arrays
IEEE Transactions on Computers
IEEE Transactions on Computers
Design of Diagnosable Iterative Arrays
IEEE Transactions on Computers
A Synthesis Method for Cutpoint Cellular Arrays
IEEE Transactions on Computers
Iterative Arrays ror Radix Conversion
IEEE Transactions on Computers
Fault location in cellular arrays
AFIPS '69 (Fall) Proceedings of the November 18-20, 1969, fall joint computer conference
Circuit Structure and Switching Function Verification
IEEE Transactions on Computers
Testing for faults in combinational cellular logic arrays
FOCS '67 Proceedings of the 8th Annual Symposium on Switching and Automata Theory (SWAT 1967)
Testability Conditions for Bilateral Arrays of Combinational Cells
IEEE Transactions on Computers
A minimum test set for multiple fault detection on ripple carry adders
IEEE Transactions on Computers
A Testable Design of Iterative Logic Arrays
IEEE Transactions on Computers
Self-Diagnosing Cellular Implementations of Finite-State Machines
IEEE Transactions on Computers
Fault Detection in Bilateral Arrays of Combinational Cells
IEEE Transactions on Computers
ALADIN: a multilevel testability analyzer for VLSI system design
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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The problem of detecting faults in arbitrarily large unilateral iterative arrays of combinational cells when any number of modules can be faulty and each module can fail in an arbitrary manner has been considered. A simple design criterion has been given which if incorporated makes the array easily diagnosable. Methods of deriving test sets for the modified arrays, which requires rather trivial computations and no complicated algorithms, have been given. The tests obtained are largely independent of the behavior of the individual modules in the array and are efficient. It has also been shown that Maitra cascades, group cascades, and cutpoint cellular arrays are testable without any modification. Methods of obtaining test sets for these special arrays have been given. Arrays of more than two dimensions have also been considered.