Fault Detection in Iterative Logic Arrays
IEEE Transactions on Computers
Truth-Table Verification of an Iterative Logic Array
IEEE Transactions on Computers
Multiple Fault Detection in Arrays of Combinational Cells
IEEE Transactions on Computers
Easily Testable Iterative Systems
IEEE Transactions on Computers
Fault Detection in Bilateral Arrays of Combinational Cells
IEEE Transactions on Computers
Testing for faults in combinational cellular logic arrays
FOCS '67 Proceedings of the 8th Annual Symposium on Switching and Automata Theory (SWAT 1967)
Testability Conditions for Bilateral Arrays of Combinational Cells
IEEE Transactions on Computers
A minimum test set for multiple fault detection on ripple carry adders
IEEE Transactions on Computers
Robust Sequential Fault Testing of Iterative Logic Arrays
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Parameterizable Testing Scheme for FIR Filters
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Accumulator-based pseudo-exhaustive two-pattern generation
Journal of Systems Architecture: the EUROMICRO Journal
Design-for-testability techniques for CORDIC design
Microelectronics Journal
Recursive pseudo-exhaustive two-pattern generation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
ALADIN: a multilevel testability analyzer for VLSI system design
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Testable design of unilateral iterative logic arrays (ILA) of combinational cells under the assumption of a single cell failure is considered. The concepts of one-step testability and one-step C-testability are introduced. Methods to modify the basic cell flow table so as to facilitate fault detection and location are given. It is shown that if no directly observable outputs from each cell are available, then it is possible to augment the cell flow table by the addition of a fixed number (=4) of columns and a row so that a faulty cell can be located by a test of length proportional to log2p, where p is the number of cells in the array. However, if directly observable outputs are available from each cell, then the test length is shown to be independent of the array length to locate a faulty cell.