Fault-Diagnosis for a Class of Multistage Interconnection Networks

Authors:
Tse-Yun Feng; Chuan-Lin Wu
Affiliations:
Department of Computer and Information Science, The Ohio State University;-
Venue:
IEEE Transactions on Computers
Year:
1981

Citing 5
Cited 9

Data Manipulating Functions in Parallel Processors and Their Implementations

IEEE Transactions on Computers
The Indirect Binary n-Cube Microprocessor Array

IEEE Transactions on Computers
The Reverse-Exchange Interconnection Network

IEEE Transactions on Computers
On a Class of Multistage Interconnection Networks

IEEE Transactions on Computers
Access and Alignment of Data in an Array Processor

IEEE Transactions on Computers

The Load-Sharing Banyan Network

IEEE Transactions on Computers
Fault-Tolerant Single-Stage Interconnectiohl Networks

IEEE Transactions on Computers
On the multiple fault diagnosis of multistage interconnection networks: the lower bound and the CMOS fault model

ICPP '97 Proceedings of the international Conference on Parallel Processing
A fault location technique and alternate routing in Benes network

ATS '95 Proceedings of the 4th Asian Test Symposium
Performance analysis and fault tolerance of randomized routing on Clos networks

FRONTIERS '96 Proceedings of the 6th Symposium on the Frontiers of Massively Parallel Computation
Design of a 2 × 2 fault-tolerant switching element

ISCA '82 Proceedings of the 9th annual symposium on Computer Architecture
Diagnosing crosstalk-faulty switches in photonic networks

SRDS '96 Proceedings of the 15th Symposium on Reliable Distributed Systems
The Gamma Network

IEEE Transactions on Computers
The Extra Stage Cube: A Fault-Tolerant Interconnection Network for Supersystems

IEEE Transactions on Computers

Quantified Score

Hi-index	14.99

Visualization

Abstract

To study the fault-diagnosis method for a class of multistage interconnection networks a general fault model is first constructed. Specific steps for diagnosing single faults and detecting multiple faults in interconnection networks such as the indirect binary n-cube network and the flip network are then developed. The following results are derived in this study: 1) independent of the network size, only four tests are required for detecting a single fault; 2) the number of tests required for locating a single fault and determining the fault type ranges from 4 to max(12, 6 + 2 ?log2(log2N)?) except for four types of single faults in the switching elements which cannot be pinpointed at the switching element level where N is the number of inputs/outputs; 3) only four tests are required for locating a single fault if the switching element is designed in such a way that any physical defection of the switching element causes both outputs of the related switching element to be faulty; and 4) multiple faults can be detected by 2(1 + log2N) tests.