Techniques for unit-delay compiled simulation
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Design for Testability A Survey
IEEE Transactions on Computers
IEEE Transactions on Computers
Deductive Fault Simulation with Functional Blocks
IEEE Transactions on Computers
Modeling and Digital Simulation for Design Verification and Diagnosis
IEEE Transactions on Computers
LSI logic testing: an overview
IEEE Transactions on Computers
Evaluation of a fan out stem based fault simulation in sequential circuits
Mathematical and Computer Modelling: An International Journal
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A comparison of the central processing unit (CPU) time and storage requirements for the parallel and deductive fault simulation techniques is presented. Versions of a parallel and deductive simulator were implemented and the comparison performed on an IBM System/360 Model 67 by simulating representative circuits including shift registers, sequencers, counters, two memory units, and a processor. Th