IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special issue on low power electronics and design
Fundamentals of modern VLSI devices
Fundamentals of modern VLSI devices
Statistical design and optimization of SRAM cell for yield enhancement
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Variability in sub-100nm SRAM designs
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Statistical analysis of SRAM cell stability
Proceedings of the 43rd annual Design Automation Conference
Reducing SRAM power using fine-grained wordline pulsewidth control
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Proceedings of the Conference on Design, Automation and Test in Europe
Efficient SRAM failure rate prediction via Gibbs sampling
Proceedings of the 48th Design Automation Conference
Statistical SRAM read access yield improvement using negative capacitance circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Proceedings of the International Conference on Computer-Aided Design
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The increase of process variations in advanced CMOS technologies is considered one of the biggest challenges for SRAM designers. This is aggravated by the strong demand for lower cost and power consumption, higher performance and density which complicates SRAM design process. In this paper, we present a methodology for statistical simulation of SRAM read access yield, which is tightly related to SRAM performance and power consumption. The proposed flow enables early SRAM yield predication and performance/power optimization in the design time, which is important for SRAM in nanometer technologies. The methodology is verified using measured silicon yield data from a 1 Mb memory fabricated in an industrial 45nm technology.