Handling inverted temperature dependence in static timing analysis
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Temperature-insensitive synthesis using multi-vt libraries
Proceedings of the 18th ACM Great Lakes symposium on VLSI
Algorithms for minimizing standby power in deep submicrometer, dual-Vt CMOS circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Temperature- and Voltage-Aware Timing Analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Collaborative voltage scaling with online STA and variable-latency datapath
Proceedings of the 20th symposium on Great lakes symposium on VLSI
Dual-Vt assignment policies in ITD-aware synthesis
Microelectronics Journal
Inversed temperature dependence aware clock skew scheduling for sequential circuits
Proceedings of the Conference on Design, Automation and Test in Europe
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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The effects of temperature on delay depend on several parameters, such as cell size, load, supply voltage, and threshold voltage. In particular, variations in Vth can yield a temperature inversion effect causing a decreases of cell delay as temperature increases. This phenomenon, besides affecting timing analysis of a design, has important and unforeseeable consequences on power optimization techniques. In this paper, we focus on the impact of such effects on multi-Vt design; in particular, we show how traditional dual-Vt optimization may yield timing errors in circuits by ignoring temperature effects. Moreover, we present a temperature-aware dual-Vt optimization technique that reduces leakage power and can guarantee that the circuit is timing feasible at the boundary temperatures provided by the technology library. Our experiments show an average 27% leakage reduction with respect to a non temperature-aware design flow.