Dynamic voltage scaling of supply and body bias exploiting software runtime distribution

  • Authors:
  • Sungpack Hong;Sungjoo Yoo;Byeong Bin;Kyu-Myung Choi;Soo-Kwan Eo;Taehwan Kim

  • Affiliations:
  • Stanford University;Samsung Electronics;Samsung Electronics;Samsung Electronics;Samsung Electronics;Seoul National University

  • Venue:
  • Proceedings of the conference on Design, automation and test in Europe
  • Year:
  • 2008

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Abstract

This paper presents a method of dynamic voltage scaling (DVS) that tackles both switching and leakage power with combined Vdd/Vbs scaling and gives minimum average energy consumption exploiting the runtime distribution of software execution. We present a mathematical formulation of the DVS problem and an efficient numerical solution. Experimental results show that the presented method shows up to 44% further reduction in energy consumption compared with existing methods. Especially, when the leakage power consumption is significant, i.e. when temperature is high, the presented method is proven to be the most effective.