Efficient 3D characterization of raised topological defects in smooth specular coatings

  • Authors:
  • Pradeep Gnanaprakasam;Johné M. Parker;Subburengan Ganapathiraman;Zhen Hou

  • Affiliations:
  • SMC, Inc., 1729 Jaggie Fox Way, Lexington, KY 40511, USA;Department of Mechanical Engineering, University of Kentucky, 151 Ralph G. Anderson, Lexington, KY 40506-0503, USA;Department of Mechanical Engineering, University of Kentucky, 151 Ralph G. Anderson, Lexington, KY 40506-0503, USA;Department of Mechanical Engineering, University of Kentucky, 151 Ralph G. Anderson, Lexington, KY 40506-0503, USA

  • Venue:
  • Image and Vision Computing
  • Year:
  • 2009

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Abstract

Many smooth, highly specular coatings, such as automotive paints and appliance coatings, are subjected to considerable performance demands and manufacturers spend significant sums each year to monitor and repair coating surface quality. Additionally, changing product specifications and environmental regulations will continue to affect the processing parameters that influence surface appearance and quality. Therefore, it is vital to develop robust methods to monitor surface quality on-line and continuously examine the processes that significantly affect surface appearance in real-time. As a critical step, this paper presents a cost-effective machine vision system design that utilizes surface reflectance models as a rational basis. Experimental and numerical investigations of diffuse angle images of specular coated surfaces confirm that these images yield a three-dimensional characterization of surface defects, efficiently, from a single image.