Computer
Logic verification algorithms and their parallel implementation
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
A topological search algorithm for ATPG
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
A parallel branch and bound algorithm for test generation
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Algorithms for Automatic Test-Pattern Generation
IEEE Design & Test
Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits
Journal of Electronic Testing: Theory and Applications
A Mixed Heuristic for Circuit Partitioning
Computational Optimization and Applications
Optimal Granularity and Scheme of Parallel Test Generation in a Distributed System
IEEE Transactions on Parallel and Distributed Systems
A Parallel Transitive Closure Computation Algorithm for VLSI Test Generation
PARA '02 Proceedings of the 6th International Conference on Applied Parallel Computing Advanced Scientific Computing
Parallel Genetic Algorithms for Simulation-Based Sequential Circuit Test Generation
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
A Parallel Multilevel Metaheuristic for Graph Partitioning
Journal of Heuristics
Multilevel heuristic algorithm for graph partitioning
EvoWorkshops'03 Proceedings of the 2003 international conference on Applications of evolutionary computing
GPU-based n-detect transition fault ATPG
Proceedings of the 50th Annual Design Automation Conference
Hi-index | 4.10 |
Some of the more widely used serial automatic test pattern generation (ATPG) algorithms and their stability for implementation on a parallel machine are discussed. The basic classes of parallel machines are examined to determine what characteristics they require of an algorithm if they are to implement it efficiently. Several techniques that have been used to parallelize ATPG are presented. They fall into five major categories: fault partitioning, heuristic parallelization, search-space partitioning, functional (algorithmic) partitioning, and topological partitioning. In each category, an overview is given of the technique, its advantages and disadvantages, the type of parallel machine it has been implemented on, and the results.