Test pattern generation for crosstalk fault of high-speed interconnect

Authors:
Shang Yuling;Li Yushan
Affiliations:
CAD Institute, Xi Dian University, Xi'an, China and School of Electronic Engineering, Guilin University of Electronic Technology, Guilin, China;CAD Institute, Xi Dian University, Xi'an, China
Venue:
ICC'08 Proceedings of the 12th WSEAS international conference on Circuits
Year:
2008

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Abstract

Embedded systems are components integrating software and hardware that are jointly and specifically designed to provide given functionalities, which are often critical. They are used in a very wide array of application areas - including transport, consumer ...