On average power dissipation and random pattern testability of CMOS combinational logic networks

  • Authors:
  • A. Shen;A. Ghosh;S. Devadas;K. Keutzer

  • Affiliations:
  • -;-;-;-

  • Venue:
  • ICCAD '92 1992 IEEE/ACM international conference proceedings on Computer-aided design
  • Year:
  • 1992

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Abstract