NOVA: state assignment of finite state machines for optimal two-level logic implementations
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Finite state machine synthesis with embedded test function
Journal of Electronic Testing: Theory and Applications
Fault detecting experiments for sequential circuits
SWCT '64 Proceedings of the 1964 Proceedings of the Fifth Annual Symposium on Switching Circuit Theory and Logical Design
Combined optimization of area and testability during state assignment of PLA-based FSM's
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
Journal of Electronic Testing: Theory and Applications
Hi-index | 0.00 |