Finite state machine synthesis with embedded test function

Finite state machine synthesis with fault tolerant test function

DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference

Cellular scan test generation for sequential circuits

EURO-DAC '92 Proceedings of the conference on European design automation

An efficient procedure for the synthesis of fast self-testable controller structures

ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design

Testable synthesis of high complex control devices

EURO-DAC '95/EURO-VHDL '95 Proceedings of the conference on European design automation

Functional design for testability of control-dominated architectures

ACM Transactions on Design Automation of Electronic Systems (TODAES)

Design for Testability Using State Distances

Journal of Electronic Testing: Theory and Applications - Special issue on test synthesis

A Non-Scan Approach to DFT for Controllers Achieving 100% Fault Efficiency

Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98

Theory and Application of Nongroup Cellular Automata for Synthesis of Easily Testable Finite State Machines

IEEE Transactions on Computers

Sequential Circuit Testing: From DFT to SFT

VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications

A Degree-of-Freedom Based Synthesis Scheme for Sequential Machines with Enhanced BIST Quality and Reduced Area

Journal of Electronic Testing: Theory and Applications

A New Design-for-Testability Method Based on Thru-Testability

Journal of Electronic Testing: Theory and Applications