ASF: a practical simulation-based methodology for the synthesis of custom analog circuits
Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
A comparative study of MOS VCOs for low voltage high performance operation
Proceedings of the 2004 international symposium on Low power electronics and design
NSGA-based parasitic-aware optimization of a 5GHz low-noise VCO
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
CMOS Circuit Design, Layout, and Simulation, Second Edition
CMOS Circuit Design, Layout, and Simulation, Second Edition
Parasitic-aware design and optimization of a fully integrated CMOS wideband amplifier
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Parasitic Aware Process Variation Tolerant Voltage Controlled Oscillator (VCO) Design
ISQED '08 Proceedings of the 9th international symposium on Quality Electronic Design
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Hi-index | 0.00 |
This paper proposes a novel flow for parasitic and process-variation aware design of radio-frequency integrated circuits (RFICs). A nano-CMOS current-starved voltage controlled oscillator (VCO) circuit has been designed using this flow as a case study. The oscillation frequency is considered as the objective optimization function with the area overhead as constraint. Extensive Monte Carlo simulations have been carried out on the parasitic extracted netlist of the VCO to study the effect of process variation on the oscillation frequency. In the design cycle, a performance degradation of 43.5% is observed when the parasitic extracted netlist is subjected to worst-case process variation. The proposed design flow could bring the oscillation frequency within 4.5% of the target, leading to convergence of the complete design in only one design iteration. To the best of the authors' knowledge, this paper presents the first work focussed on a current starved VCO in which the combined effect of parasitics and process variations has been considered.