BAT: the bit-level analysis tool

  • Authors:
  • Panagiotis Manolios;Sudarshan K. Srinivasan;Daron Vroon

  • Affiliations:
  • College of Computing, Georgia Institute of Technology, Atlanta, GA;School of Electrical & Computer Engineering, Georgia Institute of Technology, Atlanta, GA;College of Computing, Georgia Institute of Technology, Atlanta, GA

  • Venue:
  • CAV'07 Proceedings of the 19th international conference on Computer aided verification
  • Year:
  • 2007

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Abstract

While effective methods for bit-level verification of low-level properties exist, system-level properties that entail reasoning about a significant part of the design pose a major verification challenge. We present the Bit-level Analysis Tool (BAT), a state-of-the-art decision procedure for bit-level reasoning that implements a novel collection of techniques targeted towards enabling the verification of system-level properties. Key features of the BAT system are an expressive strongly-typed modeling and specification language, a fully automatic and efficient memory abstraction algorithm for extensional arrays, and a novel CNF generation algorithm. The BAT system can be used to automatically solve system-level RTL verification problems that were previously intractable, such as refinement-based verification of RTL-level pipelined machines.