Topology-driven cell layout migration with collinear constraints

Authors:
De-Shiun Fu;Ying-Zhih Chaung;Yen-Hung Lin;Yih-Lang Li
Affiliations:
Computer Science Department, National Chiao Tung University, Hsin-Chu, Taiwan;Computer Science Department, National Chiao Tung University, Hsin-Chu, Taiwan;Computer Science Department, National Chiao Tung University, Hsin-Chu, Taiwan;Computer Science Department, National Chiao Tung University, Hsin-Chu, Taiwan
Venue:
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
Year:
2009

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Abstract

Traditional layout migration focuses on area minimization, thus suffered wire distortion, which caused loss of layout topology. A migrated layout inheriting original topology owns original design intention and predictable property, such as wire length which determines the path delay importantly. This work presents a new rectangular topological layout to preserve layout topology and combine its flexibility of handling wires with traditional scan-line based compaction algorithm for area minimization. The proposed migration flow contains devices and wires extraction, topological layout construction, unidirectional compression combining scanline algorithm with collinear equation solver, and wire restoration. Experimental results show that cell topology is well preserved, and a several times runtime speedup is achieved as compared with recent migration research based on ILP (integer linear programming) formulation.