Algorithms for routing and testing routability of planar VLSI layouts

  • Authors:
  • C E Leiserson;F M Maley

  • Affiliations:
  • Laboratory for Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts;Laboratory for Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts

  • Venue:
  • STOC '85 Proceedings of the seventeenth annual ACM symposium on Theory of computing
  • Year:
  • 1985

Quantified Score

Hi-index 0.00

Visualization

Abstract

This paper studies the problem of routing wires in a grid among features on one layer of a VLSI chip, when a sketch of the layer is given. A sketch specifies the positions of features and the topology of the interconnecting wires. We give polynomial-time algorithms that (1) determine the routability of a sketch, and (2) produce a routing of a sketch that optimizes both individual and total wire length. These algorithms subsume most of the polynomial-time algorithms in the literature for planar routing and routability testing in the rectilinear grid model. We also provide an explicit construction of a database, called the rubber-band equivalent, to support computation involving the layout topology.