Exploiting Structural Duplication for Lifetime Reliability Enhancement
Proceedings of the 32nd annual international symposium on Computer Architecture
Impact of NBTI on SRAM Read Stability and Design for Reliability
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Modeling and minimization of PMOS NBTI effect for robust nanometer design
Proceedings of the 43rd annual Design Automation Conference
An analytical model for negative bias temperature instability
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Penelope: The NBTI-Aware Processor
Proceedings of the 40th Annual IEEE/ACM International Symposium on Microarchitecture
ISCA '08 Proceedings of the 35th Annual International Symposium on Computer Architecture
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
NBTI-aware design of NoC buffers
Proceedings of the 2013 Interconnection Network Architecture: On-Chip, Multi-Chip
Sensor-wise methodology to face NBTI stress of NoC buffers
Proceedings of the Conference on Design, Automation and Test in Europe
Employing circadian rhythms to enhance power and reliability
ACM Transactions on Design Automation of Electronic Systems (TODAES)
NBTI mitigation by optimized NOP assignment and insertion
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
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Due to fast technology scaling, negative bias temperature instability (NBTI) has become a major reliability concern in designing modern integrated circuits. In this paper, we present a simple and proactive NBTI recovery scheme targeting at critical and busy functional units with storage cells in modern microprocessors. Existing schemes have limitations when recovering these functional units. By exploiting the idle time of busy functional units at per-buffer-entry level, our scheme achieves on average 5.57x MTTF (Mean Time To Failure) improvement at the cost of