Configuration of VLSI Arrays in the Presence of Defects
Journal of the ACM (JACM)
A Comprehensive Reconfiguration Scheme for Fault-Tolerant VLSI/WSI Array Processors
IEEE Transactions on Computers
An Efficient Reconfiguration Algorithm for Degradable VLSI/WSI Arrays
IEEE Transactions on Computers
Self-Reconfigurable Mesh Array System on FPGA
DFT '00 Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
IEEE Transactions on Computers
On the reconfiguration of degradable VLSI/WSI arrays
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Integrated Row and Column Rerouting for Reconfiguration of VLSI Arrays with Four-Port Switches
IEEE Transactions on Computers
Hi-index | 0.00 |
This paper proposes an efficient techniques to reconfigure a two-dimensional degradable very large scale integration/wafer scale integration (VLSI/WSI) array under the row and column routing constraints, which has been shown to be NP-complete. The proposed VLSI/WSI array consists of identical processing elements such as processors or memory cells embedded in a 6-port switch lattice in the form of a rectangular grid. It has been shown that the proposed VLSI structure with 6-port switches eliminates the need to incorporate internal bypass within processing elements and leads to notable increase in the harvest when compared with the one using 4-port switches. A new greedy rerouting algorithm and compensation approaches are also proposed to maximize harvest through reconfiguration. Experimental results show that the proposed VLSI array with 6-port switches consistently outperforms the most efficient alternative proposed in literature, toward maximizing the harvest in the presence of fault processing elements.