Crosstalk modeling for coupled RLC interconnects with application to shield insertion

  • Authors:
  • Junmou Zhang;Eby G. Friedman

  • Affiliations:
  • Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY;Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY

  • Venue:
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • Year:
  • 2006

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Abstract

On-chip interconnect delay and crosstalk noise have become significant bottlenecks in the performance and signal integrity of deep submicrometer VLSI circuits. A crosstalk noise model for both identical and nonidentical coupled resistance-inductance-capacitance (RLC) interconnects is developed based on a decoupling technique exhibiting an average error of 6.8% as compared to SPICE. The crosstalk noise model, together with a proposed concept of effective mutual inductance, is applied to evaluate the effectiveness of the shielding technique.