NanoFabrics: spatial computing using molecular electronics
ISCA '01 Proceedings of the 28th annual international symposium on Computer architecture
Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Nanowire-based programmable architectures
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Faults, Error Bounds and Reliability of Nanoelectronic Circuits
ASAP '05 Proceedings of the 2005 IEEE International Conference on Application-Specific Systems, Architecture Processors
Eliminating wire crossings for molecular quantum-dot cellular automata implementation
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Hierarchical Probabilistic Macromodeling for QCA Circuits
IEEE Transactions on Computers
Clocking structures and power analysis for nanomagnet-based logic devices
ISLPED '07 Proceedings of the 2007 international symposium on Low power electronics and design
Probabilistic transfer matrices in symbolic reliability analysis of logic circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Probabilistic Analysis of a Molecular Quantum-Dot Cellular Automata Adder
DFT '07 Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
A system architecture solution for unreliable nanoelectronic devices
IEEE Transactions on Nanotechnology
Majority multiplexing-economical redundant fault-tolerant designs for nanoarchitectures
IEEE Transactions on Nanotechnology
Probabilistic Modeling of QCA Circuits Using Bayesian Networks
IEEE Transactions on Nanotechnology
On the Reliability of Majority Gates Full Adders
IEEE Transactions on Nanotechnology
Fabricatable Interconnect and Molecular QCA Circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Organizing wires for reliability in magnetic QCA
ACM Journal on Emerging Technologies in Computing Systems (JETC)
| Hi-index | 0.00 |
As computing technology delves deeper into the nanoscale regime, reliability is becoming a significant concern, and in response, Teramac-like systems will be the model for many early non-CMOS nanosystems. Engineering systems of this type requires understanding the inherent reliability of both the functional cells and the interconnect used to build the system, and which components are most critical. One particular nanodevice, quantum-dot cellular automata (QCA), offers unique challenges in understanding the reliability of its basic circuits since the device used for logic is also used for interconnect. In this paper, we analyze the reliability properties of two classes of QCA devices: molecular electrostatic-based and magnetic-domain-based. We use an analytic model, probabilistic transfer matrices (PTMs), to compute the inherent reliability of various nontrivial circuits. Additionally, linear regression is used to determine which components are most critical and estimated the reliability gains that may be achieved by improving the reliability of just a critical component. The results show the critical importance of different structures, especially interconnect, as used by the two classes of QCA.