Microgeometry capture using an elastomeric sensor

Authors:
Micah K. Johnson;Forrester Cole;Alvin Raj;Edward H. Adelson
Affiliations:
Massachusetts Institute of Technology;Massachusetts Institute of Technology;Massachusetts Institute of Technology;Massachusetts Institute of Technology
Venue:
ACM SIGGRAPH 2011 papers
Year:
2011

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Abstract

We describe a system for capturing microscopic surface geometry. The system extends the retrographic sensor [Johnson and Adelson 2009] to the microscopic domain, demonstrating spatial resolution as small as 2 microns. In contrast to existing microgeometry capture techniques, the system is not affected by the optical characteristics of the surface being measured---it captures the same geometry whether the object is matte, glossy, or transparent. In addition, the hardware design allows for a variety of form factors, including a hand-held device that can be used to capture high-resolution surface geometry in the field. We achieve these results with a combination of improved sensor materials, illumination design, and reconstruction algorithm, as compared to the original sensor of Johnson and Adelson [2009].