Reliability analysis of multi-path multi-stage interconnection network

Authors:
Nitin Nitin
Affiliations:
Department of CSE & IT, Jaypee University of Information Technology, Solan, India
Venue:
ICCOMP'06 Proceedings of the 10th WSEAS international conference on Computers
Year:
2006

Citing 8
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Abstract

In this paper, we examine the reliability of multi-path multi-stage interconnection networks (MINs) of different class. The bounded expressions for the time-dependent reliability for 16 × 16 Zeta Networks (ZTNs) and 16 × 16 Augmented Shuffle-Exchange Networks (ASENs) are derived. Furthermore, reliability upper bound and lower bound that is useful for the analysis of large networks is derived. The "full-access" criterion and "dead-fault" model is used for the reliability analysis. All numerical and simulation results for networks as large as 512 × 512 are provided. The studies of hardware cost and cost-effectiveness have also been carried out for network size as large as 512 × 512. The simulation study reveals that ZTNs are better in terms of cost and cost-effectiveness while both networks are equally reliable in terms of upper bounds.