DIVA: a reliable substrate for deep submicron microarchitecture design
Proceedings of the 32nd annual ACM/IEEE international symposium on Microarchitecture
METRICS: a system architecture for design process optimization
Proceedings of the 37th Annual Design Automation Conference
Transient fault detection via simultaneous multithreading
Proceedings of the 27th annual international symposium on Computer architecture
A study of slipstream processors
Proceedings of the 33rd annual ACM/IEEE international symposium on Microarchitecture
Automatically characterizing large scale program behavior
Proceedings of the 10th international conference on Architectural support for programming languages and operating systems
A Fault Tolerant Approach to Microprocessor Design
DSN '01 Proceedings of the 2001 International Conference on Dependable Systems and Networks (formerly: FTCS)
AR-SMT: A Microarchitectural Approach to Fault Tolerance in Microprocessors
FTCS '99 Proceedings of the Twenty-Ninth Annual International Symposium on Fault-Tolerant Computing
Transient-fault recovery for chip multiprocessors
Proceedings of the 30th annual international symposium on Computer architecture
Characterizing the Effects of Transient Faults on a High-Performance Processor Pipeline
DSN '04 Proceedings of the 2004 International Conference on Dependable Systems and Networks
uComplexity: Estimating Processor Design Effort
Proceedings of the 38th annual IEEE/ACM International Symposium on Microarchitecture
Rachael SPARC: An Open Source 32-bit Microprocessor Core for SoCs
DSD '06 Proceedings of the 9th EUROMICRO Conference on Digital System Design
Phoenix: Detecting and Recovering from Permanent Processor Design Bugs with Programmable Hardware
Proceedings of the 39th Annual IEEE/ACM International Symposium on Microarchitecture
Engineering trust with semantic guardians
Proceedings of the conference on Design, automation and test in Europe
Paceline: Improving Single-Thread Performance in Nanoscale CMPs through Core Overclocking
PACT '07 Proceedings of the 16th International Conference on Parallel Architecture and Compilation Techniques
Effective Optimistic-Checker Tandem Core Design through Architectural Pruning
Proceedings of the 40th Annual IEEE/ACM International Symposium on Microarchitecture
Processor Verification with hwBugHunt
ISQED '08 Proceedings of the 9th international symposium on Quality Electronic Design
Online design bug detection: RTL analysis, flexible mechanisms, and evaluation
Proceedings of the 41st annual IEEE/ACM International Symposium on Microarchitecture
Accelerating microprocessor silicon validation by exposing ISA diversity
Proceedings of the 44th Annual IEEE/ACM International Symposium on Microarchitecture
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Verification of modern processors is an expensive, time consuming, and challenging task. Although it is estimated that over half of total design time is spent on verification, we often find processors with bugs released into the market. This paper proposes an architecture that tolerates, not just the typically infrequent bugs found in current processors, but a significantly larger set of bugs. The objective is to allow for a much quicker time to market. We propose an architecture built around Beta Cores, which are cores partially verified. Our proposal intelligently activates and deactivates a simple single issue in-order Checker Core to verify a buggy superscalar out-oforder Beta Core. Our Beta Core Solution (BCS), which includes the Beta Core, the Checker Core, and the logic to detect potentially buggy situations consumes just 5% more power than the stand-alone Beta Core. We also show that performance is only slightly diminished with an average slowdown of 1.6%. By leveraging program signatures,our BCS only needs a simple in-order Checker Core, at half the frequency, to verify a complex 4 issue out-of-order Beta Core. The BCS architecture allows for a decrease in verification effort and thus a quicker time to market.