Behind the learning curve: a sketch of the learning process
Management Science
Toward a Theory of Continuous Improvement and the Learning Curve
Management Science
Data Visualization in a Web Warehouse
ER '98 Proceedings of the Workshops on Data Warehousing and Data Mining: Advances in Database Technologies
Measuring Design Quality by Measuring Design Complexity
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
Information Drill-down using Web tools
IV '97 Proceedings of the IEEE Conference on Information Visualisation
Design technology productivity in the DSM era (invited talk)
Proceedings of the 2001 Asia and South Pacific Design Automation Conference
Application of constraint-based heuristics in collaborative design
Proceedings of the 38th annual Design Automation Conference
On mismatches between incremental optimizers and instance perturbations in physical design tools
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Design of a 17-million gate network processor using a design factory
Proceedings of the 40th annual Design Automation Conference
A System for Automatic Recording and Prediction of Design Quality Metrics
ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design
Toward Quality EDA Tools and Tool Flows Through High-Performance Computing
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
uComplexity: Estimating Processor Design Effort
Proceedings of the 38th annual IEEE/ACM International Symposium on Microarchitecture
Towards simulation of chip design processes: the Request Service Model
MS '08 Proceedings of the 19th IASTED International Conference on Modelling and Simulation
Releasing efficient beta cores to market early
Proceedings of the 38th annual international symposium on Computer architecture
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We describe METRICS, a system to recover design productivity via new infrastructure for design process optimization. METRICS seeks to treat system design and implementation as a science, rather than an art. A key precept is that measuring a design process is a prerequisite to optimizing it and continuously achieving maximum productivity. METRICS (i) unobtrusively gathers characteristics of design artifacts, design process, and communications during the system development effort, and (ii) analyzes and compares that data to analogous data from prior efforts. METRICS infrastructure consists of (i) a standard metrics schema, along with metrics transmittal capabilities embedded directly into EDA tools or into wrappers around tools; (ii) a metrics data warehouse and metrics reports; (iii) data mining and visualization capabilities for project prediction, tracking, and diagnosis. We give experiences and insights gained from development and deployment of METRICS within a leading SOC design flow.