Improving the robustness of self-timed SRAM to variable Vdds

  • Authors:
  • Abdullah Baz;Delong Shang;Fei Xia;Alex Yakovlev;Alex Bystrov

  • Affiliations:
  • Microelectronic System Design Group, School of EECE, Newcastle University, Newcastle upon Tyne, England, United Kingdom;Microelectronic System Design Group, School of EECE, Newcastle University, Newcastle upon Tyne, England, United Kingdom;Microelectronic System Design Group, School of EECE, Newcastle University, Newcastle upon Tyne, England, United Kingdom;Microelectronic System Design Group, School of EECE, Newcastle University, Newcastle upon Tyne, England, United Kingdom;Microelectronic System Design Group, School of EECE, Newcastle University, Newcastle upon Tyne, England, United Kingdom

  • Venue:
  • PATMOS'11 Proceedings of the 21st international conference on Integrated circuit and system design: power and timing modeling, optimization, and simulation
  • Year:
  • 2011

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Abstract

The most efficient power saving method in digital systems is to scale Vdd, owing to the quadratic dependence of dynamic power consumption. This requires memory working under a wide range of Vdds in terms of performance and power saving requirements. A self-timed 6T SRAM was previously proposed, which adapts to the variable Vdd automatically. However due to leakage, the size of memory is restricted by process variations. This paper reports a new self-timed 10T SRAM cell with bit line keepers developed to improve robustness in order to work in a wide range of Vdds down to 0.3V under PVT variations. In addition, this paper briefly discusses the potential benefits of the self-timed SRAM for designing highly reliable systems and detecting the data retention voltage (DRV).