SWAT: simulator for waveform-accurate timing including parameter variations and transistor aging

  • Authors:
  • Christoph Knoth;Carsten Uphoff;Sebastian Kiesel;Ulf Schlichtmann

  • Affiliations:
  • nstitute for Electronic Design Automation, Technische Universität München;nstitute for Electronic Design Automation, Technische Universität München;nstitute for Electronic Design Automation, Technische Universität München;nstitute for Electronic Design Automation, Technische Universität München

  • Venue:
  • PATMOS'11 Proceedings of the 21st international conference on Integrated circuit and system design: power and timing modeling, optimization, and simulation
  • Year:
  • 2011

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Abstract

This paper presents SWAT, a highly optimised statistical timing analyser for digital circuits that combines transistor-level analysis accuracy with gate-level analysis performance. It is based upon a current source model (CSM) for logic cells which considers transistor aging and process variation. Static timing analysis is performed using a very accurate waveform model. SWAT employs waveform truncation and dedicated solvers to significantly improve analysis performance without noticeable loss of accuracy. Parameter variations and aging can be handled both by Monte Carlo simulations and by a special sensitivity propagation mode, which expresses arrival times as a function of local and global parameter variations. Simulation times for ISCAS85 circuits are less then 2s for nominal and less than 28s for sensitivity mode.