h-gamma: an RC delay metric based on a gamma distribution approximation of the homogeneous response
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Blade and razor: cell and interconnect delay analysis using current-based models
Proceedings of the 40th annual Design Automation Conference
Noise Injection and Propagation in High Performance Designs
ISQED '02 Proceedings of the 3rd International Symposium on Quality Electronic Design
First-order incremental block-based statistical timing analysis
Proceedings of the 41st annual Design Automation Conference
Stochastic Power Grid Analysis Considering Process Variations
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Proceedings of the 42nd annual Design Automation Conference
A Waveform Independent Gate Model for Accurate Timing Analysis
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Accurate delay computation for noisy waveform shapes
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
A multi-port current source model for multiple-input switching effects in CMOS library cells
Proceedings of the 43rd annual Design Automation Conference
Statistical logic cell delay analysis using a current-based model
Proceedings of the 43rd annual Design Automation Conference
Practical variation-aware interconnect delay and slew analysis for statistical timing verification
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Electronic Circuit & System Simulation Methods (SRE)
Electronic Circuit & System Simulation Methods (SRE)
PRIMA: passive reduced-order interconnect macromodeling algorithm
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Weibull-based analytical waveform model
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Timing analysis with compact variation-aware standard cell models
Integration, the VLSI Journal
Proceedings of the Conference on Design, Automation and Test in Europe
Efficient compression and handling of current source model library waveforms
Proceedings of the Conference on Design, Automation and Test in Europe
PATMOS'10 Proceedings of the 20th international conference on Integrated circuit and system design: power and timing modeling, optimization and simulation
SWAT: simulator for waveform-accurate timing including parameter variations and transistor aging
PATMOS'11 Proceedings of the 21st international conference on Integrated circuit and system design: power and timing modeling, optimization, and simulation
Current source modeling for power and timing analysis at different supply voltages
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
Integration, the VLSI Journal
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In ultra-deep sub-micron technologies, modeling waveform shapes correctly is essential for accurate timing and noise analysis. Due to process and environmental variations, there is a need for a variational waveform model that is compact, efficient and accurate. The model should capture correlations due to common dependence on process parameters. This paper proposes a waveform model derived from basic transformations of a nominal waveform in the absence of variations. The transformations are parameterized by variational quantities that capture the sensitivity of the waveform to process parameters. The resulting waveform model works well with current-source models for static timing analysis. Numerical results are presented to demonstrate the accuracy of the model both in capturing variational waveforms and in propagating waveforms through logic gates.