Power supply noise analysis methodology for deep-submicron VLSI chip design
DAC '97 Proceedings of the 34th annual Design Automation Conference
Proceedings of the 37th Annual Design Automation Conference
Random walks in a supply network
Proceedings of the 40th annual Design Automation Conference
Power grid reduction based on algebraic multigrid principles
Proceedings of the 40th annual Design Automation Conference
First-order incremental block-based statistical timing analysis
Proceedings of the 41st annual Design Automation Conference
Statistical Timing Analysis Considering Spatial Correlations using a Single Pert-Like Traversal
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Statistical Verification of Power Grids Considering Process-Induced Leakage Current Variations
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Stochastic Power Grid Analysis Considering Process Variations
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Proceedings of the 42nd annual Design Automation Conference
Fast flip-chip power grid analysis via locality and grid shells
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Stochastic variational analysis of large power grids considering intra-die correlations
Proceedings of the 43rd annual Design Automation Conference
Accurate power grid analysis with behavioral transistor network modeling
Proceedings of the 2007 international symposium on Physical design
Analysis of Power Supply Noise in the Presence of Process Variations
IEEE Design & Test
Compact modeling of variational waveforms
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Efficient algorithms for fast IR drop analysis exploiting locality
Integration, the VLSI Journal
Integrating dynamic pricing of electricity into energy aware scheduling for HPC systems
SC '13 Proceedings of the International Conference on High Performance Computing, Networking, Storage and Analysis
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We propose a parametric random walk algorithm to facilitate a feasible evaluation of a few critical network nodes under the influence of a large number of variation sources in a power grid. By combining statistical sampling sharing with random walks, we devise an efficient localized sensitivity analysis for large power distribution networks such that the analysis can be conducted without solving the complete network. We further show that this sampling-based parametric analysis can be extended from the first order sensitivity analysis to a more accurate second order analysis. By exploiting the natural spatial locality inherent in our algorithm formulation, the second order parametric analysis can be conducted very efficiently even for a large number of global and local variation sources. The proposed approach is demonstrated by analyzing large power grids under the influence of process and current loading variations to which the application of the standard brutal-force circuit simulation becomes completely infeasible. Our results have demonstrated the superior performance of the proposed algorithm both in terms of accuracy and runtime.