Proceedings of the 6th international workshop on Hardware/software codesign
Temperature-aware microarchitecture
Proceedings of the 30th annual international symposium on Computer architecture
Practical slicing and non-slicing block-packing without simulated annealing
Proceedings of the 14th ACM Great Lakes symposium on VLSI
The Impact of Technology Scaling on Lifetime Reliability
DSN '04 Proceedings of the 2004 International Conference on Dependable Systems and Networks
Exploiting Structural Duplication for Lifetime Reliability Enhancement
Proceedings of the 32nd annual international symposium on Computer Architecture
Temperature aware task scheduling in MPSoCs
Proceedings of the conference on Design, automation and test in Europe
Reliable multiprocessor system-on-chip synthesis
CODES+ISSS '07 Proceedings of the 5th IEEE/ACM international conference on Hardware/software codesign and system synthesis
Self-calibrating Online Wearout Detection
Proceedings of the 40th Annual IEEE/ACM International Symposium on Microarchitecture
Application-specific MPSoC reliability optimization
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Cost-effective slack allocation for lifetime improvement in NoC-based MPSoCs
Proceedings of the Conference on Design, Automation and Test in Europe
Lifetime reliability-aware task allocation and scheduling for MPSoC platforms
Proceedings of the Conference on Design, Automation and Test in Europe
A case for lifetime-aware task mapping in embedded chip multiprocessors
CODES/ISSS '10 Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis
Enhancing multicore reliability through wear compensation in online assignment and scheduling
Proceedings of the Conference on Design, Automation and Test in Europe
Mapping on multi/many-core systems: survey of current and emerging trends
Proceedings of the 50th Annual Design Automation Conference
Reliability and performance optimization of pipelined real-time systems
Journal of Parallel and Distributed Computing
Cost-effective lifetime and yield optimization for NoC-based MPSoCs
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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As transistors continue to become smaller, they become exponentially susceptible to permanent wearout faults. Without mitigation, these types of faults will render systems useless within unacceptably short time periods. Our work presents the design for a runtime task mapping subsystem which mitigates these faults using a wear-based heuristic. We compare our wear-based heuristic to power- and temperature-based heuristics used within the same system framework. Using a wide range of synthetic and real-world benchmarks, we show that our wear-based heuristic is able to improve total system lifetime by an average of 7.1% over temperature-based heuristics. Additionally, we show that our wear-based heuristic can be used to drastically improve the time to the first component failure (TTFF) of a system. TTFF is a metric that is of interest to designers who wish to avoid the design and verification difficulties of systems which are expected to recover after a component failure. Our wear-based heuristic improves TTFF by an average of 14.6% over temperature-based heuristics across all of our benchmarks. Our observations lead us to conclude that runtime, wear-based task mapping must be incorporated into systems for which lifetime is a primary design goal.