IEEE Transactions on Computers
Temperature-aware microarchitecture
Proceedings of the 30th annual international symposium on Computer architecture
The Case for Lifetime Reliability-Aware Microprocessors
Proceedings of the 31st annual international symposium on Computer architecture
The Impact of Technology Scaling on Lifetime Reliability
DSN '04 Proceedings of the 2004 International Conference on Dependable Systems and Networks
Exploiting Structural Duplication for Lifetime Reliability Enhancement
Proceedings of the 32nd annual international symposium on Computer Architecture
Reliable multiprocessor system-on-chip synthesis
CODES+ISSS '07 Proceedings of the 5th IEEE/ACM international conference on Hardware/software codesign and system synthesis
Power and reliability management of SoCs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Symbolic reliability analysis and optimization of ECU networks
Proceedings of the conference on Design, automation and test in Europe
Application-specific MPSoC reliability optimization
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Vicis: a reliable network for unreliable silicon
Proceedings of the 46th Annual Design Automation Conference
Fixed-outline floorplanning: enabling hierarchical design
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Chip-set for video display of multimedia information
IEEE Transactions on Consumer Electronics
A case for lifetime-aware task mapping in embedded chip multiprocessors
CODES/ISSS '10 Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis
Lifetime improvement through runtime wear-based task mapping
Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis
Mapping on multi/many-core systems: survey of current and emerging trends
Proceedings of the 50th Annual Design Automation Conference
Thermal-constrained task allocation for interconnect energy reduction in 3-D homogeneous MPSoCs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Cost-effective lifetime and yield optimization for NoC-based MPSoCs
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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Wear-out related permanent faults are projected to make system lifetime a critical issue for all designs. In embedded systems, lifetime can be increased using slack, underutilization in execution and storage resources, so that when components fail, data and tasks can be re-mapped and re-scheduled. The design space of possible slack allocation is both large and complex. However, based on the observation that useful slack is often quantized, we have developed an approach that effectively and efficiently allocates execution and storage slack to jointly optimize system lifetime and cost. While exploring less than 1.4% of the slack allocation design space, our approach consistently outperforms alternative slack allocation techniques to find sets of designs within 1.4% of the lifetime-cost Pareto-optimal front.