Point sampling with uniformly distributed lines

  • Authors:
  • J. Rovira;P. Wonka;F. Castro;M. Sbert

  • Affiliations:
  • Institut d'Informàtica i Aplicacions, Universitat de Girona, Spain;Arizona State University;Institut d'Informàtica i Aplicacions, Universitat de Girona, Spain;Institut d'Informàtica i Aplicacions, Universitat de Girona, Spain

  • Venue:
  • SPBG'05 Proceedings of the Second Eurographics / IEEE VGTC conference on Point-Based Graphics
  • Year:
  • 2005

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Abstract

In this paper we address the problem of extracting representative point samples from polygonal models. The goal of such a sampling algorithm is to find points that are evenly distributed. We propose star-discrepancy as a measure for sampling quality and propose new sampling methods based on global line distributions. We investigate several line generation algorithms including an efficient hardware-based sampling method. Our method contributes to the area of point-based graphics by extracting points that are more evenly distributed than by sampling with current algorithms.